A WS2 outlier wafer with lower mobility and higher Rc is linked to smoother HfO2/AlOx top oxide growth (Fig. 4 (e)), which may be indicative of lower quality WS2 with more defects to facilitate better ALD …

ttempts to write outlier devices which may have low switching probability. Two bits show faults – a stuck-at-1 fault due o incorrect device RP and a retention fault due to small hysteresis

bit of an outlier in that the low-frequency (<5GHz) performance profile was significantly better that most of the other results. Although not practical in high-volume, it may also be useful to look at possibilities …